Design for Testability (DFT) is a field in the SOC design cycle that focuses on identifying the manufacturing defects in SOC designs. As chips continue to increase in size and complexity, which is orchestrated by the advancement in manufacturing technologies, DFT has grown to become a separate field on its own over time. DFT engineers introduce various test structures into the design flow, they also work on expanding the testability logic, interconnects, and memories. DFT training...